Chen, Fei, Xiaodong Zhao, Huiqin Chen, and Jinyu Ren. “VOID-CLOSURE BEHAVIOR AND A NEW VOID-EVOLUTION MODEL FOR VARIOUS STRESS STATES”. Materials and Technology 55, no. 1 (March 16, 2021): 105-113. Accessed September 13, 2026. https://mater-tehnol.si/index.php/MatTech/article/view/99.